Conductive Atomic Force Microscopy - pr_343650

Conductive Atomic Force Microscopy

Applications in Nanomaterials

Hardback

$297.00

Or 4 payments of $74.25 with

delivery message Free delivery for orders over $49.99

Add to Wish List
Delivered in 10 - 14 days
Available for Click and Collect
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Product code: 9783527340910

ISBN 9783527340910
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.